Analytical

High Resolution Transmission Electron Microscope (HR-TEM)
JEOL JEM-2100F

• Accelerating Voltage: 200kV
• Electron Gun: ZrO/W (100) field emission
• Resolution: 0.23 nm (point-to-point)
                      0.10 nm (lattice)
                      0.20 nm (STEM)
• Spot Size: 2-5 nm (TEM mode)
                     0.5 - 2.4 nm (analytical mode)
• Magnification: MAG mode: 2,000x - 1,500,000x
                           Low MAG mode: 50x - 6,000x
• Image Mode: High resolution
                          Bright field
                          Dark field
• CCD Camera: Gatan SC1000 ORIUS CCD camera (11 megapixel)
• EDS Unit: Oxford INCAx-sight EDS detector
                          Modes: Point analysis
                                        Line analysis
                                        Elemental mapping 

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 Scanning Electron Microscope (SEM) 
JEOL JSM-6060LV

• Accelerating Voltage: 5-30 kV
• Imaging Mode: High vacuum for regular samples
                               Low vacuum for biological samples
• Resolution: 3.5 nm (HV mode)
                         4.0 nm (LV mode)
• Magnification: 30x - 300,000x
• EDS Unit: Thermo Electron NORAN System SIX
                     Modes: Point analysis
                                    Line analysis
                                    Elemental mapping

Atomic Force Microscope (AFM)