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Khan M. Iftekharuddin, professor in the department of Electrical and Computer Engineering and director of Vision Lab, recently co-authored a book titled Image Processing. This book is published as part of the international society for optics and photonics' (SPIE) highly successful "Field Guide" series. The result of Dr. Iftekharuddin's several years of teaching a graduate course on Digital Image Processing, much of his research had focused on different aspects of computer vision and signal/image processing problems.

Digital imaging is essential to many industries, such as remote sensing, entertainment, defense, and biotechnology, and many processing techniques have been developed over time. This SPIE Field Guide serves as a resource for commonly used image-processing concepts and tools; with this foundation, readers will better understand how to apply these tools to various problems encountered in the field. Topics include filtering, time-frequency-domain processing, and image compression, morphology, and restoration.

Dr. Iftekharuddin is the principal author of more than one hundred twenty five refereed journal papers and conference proceedings and eight book chapters. He serves as an associate editor for several journals. He is also on the editorial board of the journal Computer Methods in Biomechanics and Biomedical Engineering: Imaging & Visualization (2012 - present).

His research has attracted more than $2.2M external funding from NIH, NSF, NASA, ARO, USDOT, US Navy, the Whitaker Foundation, St. Jude Children's Research Hospital, Assisi Foundation, FedEx, Upper Great Plain Transportation Institute and Timken Research. He currently serves as charter member for NIH's Biomedical Computing and Health Informatics (BCHI) study section (2009- 2013). He was named the researcher of the year in the College of Engineering and Architecture at North Dakota State University in 2000 and again in the Herff College of Engineering at University of Memphis in 2011 respectively. He is a fellow of SPIE, a senior member of IEEE & IEEE CIS, and a member of OSA.

Published on: October 1, 2012